An addition to the methods of test determination for fault detection in combinational circuits

 Ljubomir Cvetkovic1

  Acta Cybernetica 16 (2004) 545-566.

Abstract:

 We propose a procedure for determining fault detection tests for single and multiple fault in combinational circuits. The stuck-at-fault model is used. By the proposed procedure all test vectors for single and multiple stuck-at-fault in combinational circuit are determined. The path sensitization method is used in the test signal propagation while test signals are defined on a four element set. The procedure can also be applied to the fault detection in programmable logic devices. We consider two-level combinational circuits which are realized by the PAL architecture and we propose a procedure for determining a test set which detects all single stuck-at-faults. As a mathematical tool, the cube theory is used.

Footnotes

  Cvetkovic 1 Ljubomir Cvetkovic, Trg Zitna Pijaca 3, 22000 Sremska Mitrovica, Serbia and Montenegro,
JP PTT ''SERBIA''-HOLDING, Belgrade, Serbia and Montenegro.
E-mail: ljubomir@ptt.yu